• Compatible with the ProScan III system and Nikon NWL200/NWL860 wafer handling systems H116SPN Motorised semi-conductor wafer inspection shuttle stage for Nikon wafer handling systems. H116SPN Motorised semi-conductor wafer inspection shuttle stage for Nikon wafer handling systems
Get a QuoteJul 15, 2008 · The NWL200 Series also offers outstanding operability features. New wafer-slot buttons on the front panel enable users to select a specific wafer in a slot with a touch of a button. At the same time, a large LCD screen allows operators to set conditions and check the operating status at a glance.
Get a QuoteCFI60-2/CFI60 Optical System (for modular focusing unit) System Diagram & Index CCTV Camera Adapters ENG-mount Camera C-0.7× DXM Relay Lens C-mount TV Relay Lens 4× C-mount TV Adapter C-mount Adapters 0.35×/0.45×/ 0.6× C-mount TV Relay Lens 2.5× Straight Tubes LV-TT2 Tilting Trinocular Tube The development, manufacture, and evaluation of products require sub …
Get a QuoteNWL200: Nikon Wafer Loader 200. Fully secured wafer loader to our L200N microscopes for full manual or automated inspection. Incl: wafer alignment, cross-slot-detection, mark detection (notch, flat or double flat), cassette programs, sample programs, good/not-good put back, 6 & 8 inch… Option: Macro inspection, Macro image capturing, IR, …
Get a QuoteThe NWL200 series is the first lineup of wafer loaders for inspection microscopes capable of loading 100 micron thin wafers. Thanks to a new chuck system, the NWL200 series achieves highly reliable loading suitable for inspection of next-generation semiconductors.
Get a QuoteThe NWL200 wafer loader is now available for automated wafer inspection with NEXIV video measuring systems. The NWL200 series facilitates automated wafer inspection for NEXIV video measuring systems capable of loading 100 micron thin wafers. Thanks to a new chuck system, the NWL200 series achieves highly reliable loading suitable for inspection
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Get a QuoteNWL200 Series Nikon's outstanding proprietary technology makes the NWL200 Series the first lineup of wafer loaders for inspection microscopes capable of loading 100 μm thin wafers. The SEMI S2/S8 approved NWL200 Series can load ultra-thin wafers with a thinness of as little as 100 μm. This high level of safety and
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Get a QuoteThe NWL200 series is a superb line-up of wafer loader systems, capable of transferring 6 and 8 inch diameter wafers down to a thickness of 100 microns …
Get a QuoteThe NWL200 series is the first lineup of wafer loaders for inspection microscopes capable of loading 100 micron thin wafers. Thanks to a new chuck system, the NWL200 series achieves highly reliable loading suitable for inspection of next-generation semiconductors.
Get a QuoteLe chargeur de wafers NWL200 est destiné aux microscopes d'inspection en mesure de charger des wafers de 100 micromètres. La gamme NWL200 dispose d'un …
Get a QuoteNWL200 Series Nikon's outstanding proprietary technology makes the NWL200 Series the first lineup of wafer loaders for inspection microscopes capable of loading 100 μm thin wafers. The SEMI S2/S8 approved NWL200 Series can load ultra-thin wafers with a thinness of as little as 100 μm. This high level of safety and
Get a QuoteLe chargeur de wafers NWL200 est destiné aux microscopes d'inspection en mesure de charger des wafers de 100 micromètres. La gamme NWL200 dispose d'un …
Get a Quote• Compatible with the ProScan III system and Nikon NWL200/NWL860 wafer handling systems H116SPN Motorised semi-conductor wafer inspection shuttle stage for Nikon wafer handling systems. H116SPN Motorised semi-conductor wafer inspection shuttle stage for Nikon wafer handling systems
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Get a QuoteMay 29, 2013 · NWL200 Wafer Loader System für IC Prüfmikroskope Die neuen Kameras der „Digital Sight" DS-Serie von Nikon sind die ersten Mikroskop-Kameras, die mit dem Nikon CMOS-Bildsensor im FX-Format
Get a QuoteThe NWL200 series is the first lineup of wafer loaders for inspection microscopes capable of loading 100 micron thin wafers. Thanks to a new chuck system, the NWL200 series achieves highly reliable loading suitable for inspection of next-generation semiconductors. Improved wafer-sensing functions also help prevent damage to wafers. The loader
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